Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction

Name: Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction
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$20.00

- Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction is written by Rolf Erni and published by ICP. ISBNs for Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction are 9781911299479, 9781848165373, 1848165374 and the print ISBNs are 9781848165366, 1848165366.

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Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction is written by Rolf Erni and published by ICP. ISBNs for Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction are 9781911299479, 9781848165373, 1848165374 and the print ISBNs are 9781848165366, 1848165366.

Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction

$25.00

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010. Additional ISBNs 9781783265299Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction 2nd Edition is written by Rolf Erni and published by ICP. ISBNs for Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction are 9781783265305, 1783265302 and the print ISBNs are 9781783265282, 1783265280. Additional ISBNs include 9781783265299.

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Free shipping is provided for all orders over $199.
Orders under $199 will incur a flat-rate shipping fee of $7.99.
All orders shipped within the United States will be subject to a sales tax charge of 5%.

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Shipping Restrictions

Tracking Your Order

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How to Return or Exchange an Item

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Contact our customer support at contact@zetlly.com with your order number and reason for return or exchange.
Our team will respond within 24 hours to provide detailed instructions, including the specific Return Address for your shipment.
Package your item securely and include all original packaging and proof of purchase.

Return shipments should be sent to: Blanq LLC 1201 South Hope Street Apt 2413, Los Angeles, CA 90015, USA

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Items returned without prior authorization or not meeting the above conditions may not qualify for a refund or exchange.

Return Shipping Costs

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Accepted Payment Methods

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Payment Process and Confirmation

Please retain this confirmation email for your records and reference in case of any inquiries or disputes.

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM imaging.This second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.
Additional ISBNs
9781783265299Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction 2nd Edition is written by Rolf Erni and published by ICP. ISBNs for Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction are 9781783265305, 1783265302 and the print ISBNs are 9781783265282, 1783265280. Additional ISBNs include 9781783265299.